SAN RAMON, Calif. - May 26, 2008 - Solido Design Automation, innovator of process variation solutions for transistor-level integrated circuit (IC) designers, will be demonstrating solutions to head off statistical and proximity variations in analog/ mixed-signal, custom digital and memory ICs in Booth #660 at the Design Automation Conference (DAC), Anaheim Convention Center in Anaheim, California from June 8th to 13th, 2008. To register for a one-on-one suite demonstration, please visit http://www.solidodesign.com/dac08_demo.shtml
Other Solido Design Automation activities at DAC include:
Technical seminar on "Variation Robustness for Analog/Mixed-Signal, Custom Digital and Memory Design" presented by Patrick Drennan, Solido's Chief Technology Officer. This seminar will include a brief review of the physical phenomena and industry standard device models for variation sources, including random local and global variations and systematic proximity effects. New techniques to accelerate, increase accuracy and derive more information from statistical variation analysis will be presented. Free; breakfast included.
WHEN: Wednesday, June 11, 2008 from 9:00am - 10:00amTutorial on "Robust Analog/ Mixed-signal Design" featuring Trent McConaghy, Solido’s Chief Scientific Officer, as one of four speakers. Tutorial organized by Joel Phillips of Cadence Design Systems. For more detail, see http://www.dac.com/events/eventdetails.aspx?id=77-132
WHEN: Friday, June 13, 2008 from 9:00am – 5:00pmSolido Design Automation Inc. provides process variation solutions for transistor-level designers of analog/mixed-signal, custom digital, and memory integrated circuits. The privately held company is venture capital funded and has offices in U.S.A., Canada, Japan and Europe. For further information, visit www.solidodesign.com or call 306-382-4100.
PR for Solido Design Automation – Cayenne Communication LLC
Michelle Clancy, 252-940-0981, michelle.clancy@cayennecom.com