Monte Carlo+ Package
Monte Carlo+ Package Datasheet 
The Solido Monte Carlo+ package is a complete quality-driven solution to statistical variation analysis for custom IC design. The package of applications provides everything needed for designers to accurately validate their circuits using faster Monte Carlo based analysis with clear insight into the quality of results. A quality-driven approach to statistical analysis makes Monte Carlo+ a reliable solution for sign-off level verification.
Each package offered by Solido offers the ability to analyze a circuit’s capabilities against the specification, to identify the electrical hotspots that have the greatest impact on performance, and to recommend design adjustments to meet the specification. With Solido Monte Carlo+, users maximize electrical yield, reduce power, and minimize area, while making informed tradeoffs. These capabilities together maximize simulator efficiency and minimize design verification time.
Benefits
Fast
- 2-10x more efficient than Monte Carlo
- Parallel distribution across compute resources
Accurate
- Complete visibility into quality of results
- Accuracy-aware stopping criteria
- Statistical corner extraction at target yield
High capacity
- Circuits with up to 100,000 devices
- Up to100,000 samples in a single run
Unique capabilities
- Design-specific statistical corner extraction at the target sigma provides accurate corners to design against
- Accurate impacts analysis reveals causes of problems and identifies the causes directly on the schematic
- Q-Q plots help visualize non-normal characteristics in the distribution tails
Included Apps
Run Monte Carlo+
Define desired quality before analysis is started by specifying a target yield or by simply limiting the number of samples. At every stage of the analysis, the quality of results is reported with expected yield and the associated confidence interval.
Analysis is automatically stopped when the desired yield goal is proven or disproven, minimizing simulation time to only what is needed.
Results can be viewed and explored in a variety of ways using histograms, scatter plots, sensitivity plots, and Q-Q plots. All results are presented with respect to the design specification.
Statistical variation problems can be quickly and precisely debugged by extracting statistical corners at the target yield, then identifying and fixing problems using these design-specific statistical corners.
Run DesignSense
Identify the design hotspots with analysis of select devices against all design goals. DesignSense provides a clear indication of where design adjustments can be made to improve parametric performance, minimize sensitivity, reduce power, and minimize area.
DesignSense can be run at nominal or across the statistical design corners extracted in Run Monte Carlo+.
Users can quickly understand options to improve the design and the tradeoffs across all design goals.
Run Extracted Corners
Explore the effects of design changes on the performance of a design across selected standard or statistical corners. Simulate a set of corners distributed across a simulation cluster with a single click.
Track the design change history and the impact on the target specification.
