SAN RAMON, Calif. – March 10, 2008 – Solido Design Automation, innovator of process variation solutions for transistor-level designers of analog/mixed-signal, custom digital and memory integrated circuits, today announced that the company will present a technical seminar on “Variation Robustness for Analog/Mixed-Signal, Custom Digital and Memory Design” at the Design Automation and Test Europe (DATE) Conference being held on March 10 – 14, 2008 at the ICM in Munich, Germany.

WHO: Patrick Drennan, Chief Technology Officer, Solido Design Automation

WHAT: This seminar will include a review of the physical phenomena and industry standard device models for variation sources, including random local and global variations and systematic proximity effects. New techniques to accelerate, increase accuracy and derive more information from statistical variation analysis will also be presented.

WHERE: 2008 DATE Conference, Munich, Germany, at the ICM in room 2156

WHEN: 9:00 a.m. – 10:00 a.m. CET, March 12th. Continental breakfast will be served

About Solido Design Automation

Solido Design Automation Inc. provides process variation solutions for transistor-level designers of analog/mixed-signal, custom digital, and memory integrated circuits. The privately held company is venture capital funded and has offices in U.S.A., Canada, Japan and Europe. For further information, visit www.solidodesign.com or call 306-382-4100.

Editorial Contact

PR for Solido Design Automation – Cayenne Communication LLC

Michelle Clancy, 252-940-0981, michelle.clancy@cayennecom.com