Fast PVT: A Rapid, Accurate, and Reliable Method for Design and Verification of Circuits Under Process-Voltage-Temperature Conditions

Integrated Circuit designs are subject to process, voltage, and temperature (PVT) variations, often modeled as a set of PVT corners. In modern designs, there can be hundreds or thousands of PVT corners.

This paper presents the Fast PVT method, which quickly extracts the most relevant PVT corners, for use in an iterative design loop. Furthermore, Fast PVT reliably verifies designs, on average 10x faster than testing all corners. This paper then demonstrates Fast PVT on a suite of benchmark circuits, revealing some of the key traits that make Fast PVT effective.

Overview:

  1. Introduction
  2. Review of PVT Corner Approaches
  3. Fast PVT Method
  4. Fast PVT Verification: Benchmark Results
  5. Fast PVT: Discussion
  6. Conclusion

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